Yusuf Leblebici,Sung-Mo Kang: Hot-Carrier Reliability of MOS VLSI Circuits
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Author: Yusuf Leblebici,Sung-Mo Kang
Number of Pages: 212 pages
Published Date: 27 Sep 2012
Publisher: Springer-Verlag New York Inc.
Publication Country: New York, NY, United States
Language: English
ISBN: 9781461364290
Download Link: Click Here
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